Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"On-Chip Test Infrastructure Design for Optimal Multi-Site Testing of ..."

Sandeep Kumar Goel, Erik Jan Marinissen (2005)

> Home

Details and statistics

DOI: 10.1109/DATE.2005.231

access: closed

type: Conference or Workshop Paper

metadata version: 2024-02-05

- view
  authority control:
- export record
  dblp key:
  - conf/date/GoelM05
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/date/GoelM05
Sandeep Kumar Goel, Erik Jan Marinissen:
On-Chip Test Infrastructure Design for Optimal Multi-Site Testing of System Chips. DATE 2005: 44-49

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.