"Layout-Driven SOC Test Architecture Design for Test Time and Wire Length ..."

Sandeep Kumar Goel, Erik Jan Marinissen (2003)

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DOI: 10.1109/DATE.2003.10171

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Sandeep Kumar Goel, Erik Jan Marinissen:
Layout-Driven SOC Test Architecture Design for Test Time and Wire Length Minimization. DATE 2003: 10738-10741

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