"Circuit-Level Modeling for Concurrent Testing of Operational Defects due ..."

Jonathan R. Carter, Sule Ozev, Daniel J. Sorin (2005)

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DOI: 10.1109/DATE.2005.94

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Jonathan R. Carter, Sule Ozev, Daniel J. Sorin:
Circuit-Level Modeling for Concurrent Testing of Operational Defects due to Gate Oxide Breakdown. DATE 2005: 300-305

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