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"Towards Self-adaptive Defect Classification in Industrial Monitoring."

Andreas Margraf et al. (2020)

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DOI: 10.5220/0009893003180327

access: closed

type: Conference or Workshop Paper

metadata version: 2023-06-26

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  dblp key:
  - conf/data/MargrafHBG20
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  - https://dblp.org/rec/conf/data/MargrafHBG20
Andreas Margraf, Jörg Hähner, Philipp Braml, Steffen Geinitz:
Towards Self-adaptive Defect Classification in Industrial Monitoring. DATA 2020: 318-327

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