"Fault Models of CMOS Gates: An Empirical Study Based on Mutation Analysis."

Xiaofeng Tang et al. (2014)

> Home

Details and statistics

DOI: 10.1109/DASC.2014.29

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

- view
  authority control:
- export record
  dblp key:
  - conf/dasc/TangXLY14
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/dasc/TangXLY14
Xiaofeng Tang, Aiqiang Xu, Wenhai Li, Zhiyong Yang:
Fault Models of CMOS Gates: An Empirical Study Based on Mutation Analysis. DASC 2014: 115-120

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.