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"CMOS Stuck-open Fault Detection Using Single Test Patterns."

Rochit Rajsuman, Anura P. Jayasumana, Yashwant K. Malaiya (1989)

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DOI: 10.1145/74382.74511

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-06

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  dblp key:
  - conf/dac/RajsumanJM89
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  - https://dblp.org/rec/conf/dac/RajsumanJM89
Rochit Rajsuman, Anura P. Jayasumana, Yashwant K. Malaiya:
CMOS Stuck-open Fault Detection Using Single Test Patterns. DAC 1989: 714-717

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