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"Fault Characterizations and Design-for-Testability Technique for Detecting ..."
Kaamran Raahemifar, Majid Ahmadi (2001)
- Kaamran Raahemifar, Majid Ahmadi:
Fault Characterizations and Design-for-Testability Technique for Detecting IDDQ Faults in CMOS/BiCMOS Circuits. DAC 2001: 313-316
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