"DIALED: Data Integrity Attestation for Low-end Embedded Devices."

Ivan De Oliveira Nunes, Sashidhar Jakkamsetti, Gene Tsudik (2021)

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DOI: 10.1109/DAC18074.2021.9586180

access: closed

type: Conference or Workshop Paper

metadata version: 2021-11-12

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Ivan De Oliveira Nunes, Sashidhar Jakkamsetti, Gene Tsudik:
DIALED: Data Integrity Attestation for Low-end Embedded Devices. DAC 2021: 313-318

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