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"Probabilistic bug-masking analysis for post-silicon tests in ..."
Doowon Lee et al. (2016)
- Doowon Lee, Tom Kolan, Arkadiy Morgenshtein, Vitali Sokhin, Ronny Morad, Avi Ziv, Valeria Bertacco:
Probabilistic bug-masking analysis for post-silicon tests in microprocessor verification. DAC 2016: 24:1-24:6
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