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"Partitioning logic circuits to maximize fault resolution."

Ayee Goundan, John P. Hayes (1976)

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DOI: 10.1145/800146.804824

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-06

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  dblp key:
  - conf/dac/GoundanH76
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  - https://dblp.org/rec/conf/dac/GoundanH76
Ayee Goundan, John P. Hayes:
Partitioning logic circuits to maximize fault resolution. DAC 1976: 271-277

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