"Hot-Carrier Reliability Enhancement via Input Reordering and Transistor ..."

Aurobindo Dasgupta, Ramesh Karri (1996)

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DOI: 10.1145/240518.240672

access: closed

type: Conference or Workshop Paper

metadata version: 2023-11-12

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Aurobindo Dasgupta, Ramesh Karri:
Hot-Carrier Reliability Enhancement via Input Reordering and Transistor Sizing. DAC 1996: 819-824

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