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"Critical Path Monitor Enabled Dynamic Voltage Scaling for Graceful ..."

Yu-Guang Chen et al. (2014)

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DOI: 10.1145/2593069.2593115

access: closed

type: Conference or Workshop Paper

metadata version: 2022-12-13

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Yu-Guang Chen, Tao Wang, Kuan-Yu Lai, Wan-Yu Wen, Yiyu Shi, Shih-Chieh Chang:
Critical Path Monitor Enabled Dynamic Voltage Scaling for Graceful Degradation in Sub-Threshold Designs. DAC 2014: 98:1-98:6

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