"Test cost reduction for X-value elimination by scan slice ..."

Hyunsu Chae, Joon-Sung Yang (2018)

> Home

Details and statistics

DOI: 10.1145/3195970.3196127

access: closed

type: Conference or Workshop Paper

metadata version: 2023-09-30

- view
  authority control:
- export record
  dblp key:
  - conf/dac/ChaeY18
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/dac/ChaeY18
Hyunsu Chae, Joon-Sung Yang:
Test cost reduction for X-value elimination by scan slice correlation analysis. DAC 2018: 78:1-78:6

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.