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"Characterizing Process Variation in Nanometer CMOS."

Kanak Agarwal, Sani R. Nassif (2007)

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DOI: 10.1145/1278480.1278582

access: closed

type: Conference or Workshop Paper

metadata version: 2024-06-04

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Kanak Agarwal, Sani R. Nassif:
Characterizing Process Variation in Nanometer CMOS. DAC 2007: 396-399

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