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"Polarimetric iToF: Measuring High-Fidelity Depth Through Scattering Media."

Daniel S. Jeon et al. (2023)

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DOI: 10.1109/CVPR52729.2023.01189

access: closed

type: Conference or Workshop Paper

metadata version: 2023-08-29

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  dblp key:
  - conf/cvpr/JeonMB023
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Daniel S. Jeon, Andreas Meuleman, Seung-Hwan Baek, Min H. Kim:
Polarimetric iToF: Measuring High-Fidelity Depth Through Scattering Media. CVPR 2023: 12353-12362

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