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"Spot and Learn: A Maximum-Entropy Patch Sampler for Few-Shot Image ..."
Wen-Hsuan Chu et al. (2019)
- Wen-Hsuan Chu, Yu-Jhe Li, Jing-Cheng Chang, Yu-Chiang Frank Wang:
Spot and Learn: A Maximum-Entropy Patch Sampler for Few-Shot Image Classification. CVPR 2019: 6251-6260
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