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"A Novel Delay Fault Testing Methodology for Resistive Faults in Deep ..."

M. Reza Javaheri, Reza Sedaghat (2008)

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DOI: 10.1007/978-3-540-89985-3_80

access: closed

type: Conference or Workshop Paper

metadata version: 2021-04-20

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  - conf/csicc/JavaheriS08
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M. Reza Javaheri, Reza Sedaghat:
A Novel Delay Fault Testing Methodology for Resistive Faults in Deep Sub-micron Technologies. CSICC 2008: 653-660

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