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"DSP-Based Industrial Defect Detection for Intelligent Manufacturing."

Han Yue et al. (2023)

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DOI: 10.1109/CSCWD57460.2023.10152825

access: closed

type: Conference or Workshop Paper

metadata version: 2023-08-05

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  - conf/cscwd/YueWGXZ23
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  - https://dblp.org/rec/conf/cscwd/YueWGXZ23
Han Yue, Rucen Wang, Yi Gao, Ailing Xia, Jianhua Zhang:
DSP-Based Industrial Defect Detection for Intelligent Manufacturing. CSCWD 2023: 1667-1672

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