"Time, Memory and Accuracy Tradeoffs in Side-Channel Trace Profiling."

Hen Hayoon, Yossi Oren (2022)

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DOI: 10.1007/978-3-031-07689-3_3

access: closed

type: Conference or Workshop Paper

metadata version: 2023-11-12

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Hen Hayoon, Yossi Oren:
Time, Memory and Accuracy Tradeoffs in Side-Channel Trace Profiling. CSCML 2022: 29-46

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