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"HATBED: a distributed hardware assisted testbed for non-invasive profiling ..."

Yi Li, Junyan Ma, Te Zhang (2019)

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DOI: 10.1145/3312480.3313172

access: closed

type: Conference or Workshop Paper

metadata version: 2019-04-05

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Yi Li, Junyan Ma, Te Zhang:
HATBED: a distributed hardware assisted testbed for non-invasive profiling of IoT devices. Bench@CPSIoTWeek 2019: 13-17

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