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"Generalized Pattern Matching and the Complexity of Unavoidability Testing."

Christine E. Heitsch (2001)

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DOI: 10.1007/3-540-48194-X_20

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-26

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Christine E. Heitsch:
Generalized Pattern Matching and the Complexity of Unavoidability Testing. CPM 2001: 219-230

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