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"Generation of Test Patterns for Differential Diagnosis of Digital Circuits."

Francisco Azevedo, Pedro Barahona (1998)

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DOI: 10.1007/3-540-49481-2_33

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-02

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  - conf/cp/AzevedoB98
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Francisco Azevedo, Pedro Barahona:
Generation of Test Patterns for Differential Diagnosis of Digital Circuits. CP 1998: 462

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