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"Improving Defect Detection Ability of Derived Test Cases Based on Mutated ..."

Haiying Sun et al. (2016)

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DOI: 10.1109/COMPSAC.2016.136

access: closed

type: Conference or Workshop Paper

metadata version: 2023-11-12

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  dblp key:
  - conf/compsac/SunCZLZ16
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  persistent URL:
  - https://dblp.org/rec/conf/compsac/SunCZLZ16
Haiying Sun, Mingsong Chen, Min Zhang, Jing Liu, Ying Zhang:
Improving Defect Detection Ability of Derived Test Cases Based on Mutated UML Activity Diagrams. COMPSAC 2016: 275-280

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