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"Statistical prediction of circuit aging under process variations."

Wenping Wang et al. (2008)

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DOI: 10.1109/CICC.2008.4672007

access: closed

type: Conference or Workshop Paper

metadata version: 2018-09-01

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  dblp key:
  - conf/cicc/WangRYBKC08
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  - https://dblp.org/rec/conf/cicc/WangRYBKC08
Wenping Wang, Vijay Reddy, Bo Yang, Varsha Balakrishnan, Srikanth Krishnan, Yu Cao:
Statistical prediction of circuit aging under process variations. CICC 2008: 13-16

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