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"An Integrated Modeling Paradigm of Circuit Reliability for 65nm CMOS ..."

Wenping Wang et al. (2007)

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DOI: 10.1109/CICC.2007.4405783

access: closed

type: Conference or Workshop Paper

metadata version: 2018-08-28

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Wenping Wang, Vijay Reddy, Anand T. Krishnan, Rakesh Vattikonda, Srikanth Krishnan, Yu Cao:
An Integrated Modeling Paradigm of Circuit Reliability for 65nm CMOS Technology. CICC 2007: 511-514

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