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"Dynamic NBTI management using a 45nm multi-degradation sensor."

Prashant Singh et al. (2010)

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DOI: 10.1109/CICC.2010.5617412

access: closed

type: Conference or Workshop Paper

metadata version: 2018-07-31

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  dblp key:
  - conf/cicc/SinghKSB10
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Prashant Singh, Eric Karl, Dennis Sylvester, David T. Blaauw:
Dynamic NBTI management using a 45nm multi-degradation sensor. CICC 2010: 1-4

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