"Robust ultra-low voltage ROM design."

Mingoo Seok et al. (2008)

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DOI: 10.1109/CICC.2008.4672110

access: closed

type: Conference or Workshop Paper

metadata version: 2018-07-31

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Mingoo Seok, Scott Hanson, Jae-sun Seo, Dennis Sylvester, David T. Blaauw:
Robust ultra-low voltage ROM design. CICC 2008: 423-426

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