"Impact of subthreshold hump on bulk-bias dependence of offset voltage ..."

Kiyohiko Sakakibara, Toshio Kumamoto, K. Arimoto (2012)

Details and statistics

DOI: 10.1109/CICC.2012.6330574

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-17

a service of  Schloss Dagstuhl - Leibniz Center for Informatics