"Materials challenges for III-V/Si co-integrated CMOS."

D. K. Sadana et al. (2015)

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DOI: 10.1109/CICC.2015.7338398

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-17

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D. K. Sadana, C.-W. Cheng, B. Wacaser, W. Spratt, K. T. Shiu, Stephen W. Bedell:
Materials challenges for III-V/Si co-integrated CMOS. CICC 2015: 1-6

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