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"Solution to ESD Induced Pocket Isolation Failure in Multi Well CMOS."

Troy Ruud et al. (2007)

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DOI: 10.1109/CICC.2007.4405724

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-17

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Troy Ruud, Bryce Rasmussen, Bruce Greenwood, Matthew Tyler:
Solution to ESD Induced Pocket Isolation Failure in Multi Well CMOS. CICC 2007: 245-248

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