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"Mismatch analysis and statistical design at 65 nm and below."
Larry T. Pileggi et al. (2008)
- Larry T. Pileggi, Gökçe Keskin, Xin Li, Ken Mai
, Jonathan E. Proesel:
Mismatch analysis and statistical design at 65 nm and below. CICC 2008: 9-12
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