"Reliability challenges for the continued scaling of IC technologies."

Anthony S. Oates (2012)

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DOI: 10.1109/CICC.2012.6330658

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-17

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Anthony S. Oates:
Reliability challenges for the continued scaling of IC technologies. CICC 2012: 1-4

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