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"Session 8 - Characterization and test methods for device variability in ..."

Hamid Mahmoodi, Jeanne Trinko Mechler (2008)

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DOI: 10.1109/CICC.2008.4672035

access: closed

type: Conference or Workshop Paper

metadata version: 2020-10-25

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Hamid Mahmoodi, Jeanne Trinko Mechler:
Session 8 - Characterization and test methods for device variability in nanoscale technologies. CICC 2008

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