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"Substrate cross talk noise characterization and prevention in 0.35 ..."

John P. Z. Lee et al. (1999)

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DOI: 10.1109/CICC.1999.777326

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-30

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John P. Z. Lee, Frank Wang, Abhijit Phanse, Linda C. Smith:
Substrate cross talk noise characterization and prevention in 0.35 mμm CMOS technology. CICC 1999: 479-482

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