"Modeling the gate-related high-frequency and noise characteristics of ..."

Rainer Kraus, Gerhard Knoblinger (2002)

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DOI: 10.1109/CICC.2002.1012798

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type: Conference or Workshop Paper

metadata version: 2022-10-04

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Rainer Kraus, Gerhard Knoblinger:
Modeling the gate-related high-frequency and noise characteristics of deep-submicron MOSFETs. CICC 2002: 209-212

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