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"A 28nm All-Digital Droop Detection and Mitigation Circuit Using a Shared ..."
Minyoung Kang et al. (2024)
- Minyoung Kang, Sunghoon Kim, Youngmin Park, Sangsu Jeong, Dongsuk Jeon:
A 28nm All-Digital Droop Detection and Mitigation Circuit Using a Shared Dual-Mode Delay Line with 14.8% VminReduction and 42.9% Throughput Gain. CICC 2024: 1-2
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