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"Analyzing the impact of Double Patterning Lithography on SRAM variability ..."
Vivek Joshi et al. (2010)
- Vivek Joshi, Michael Wieckowski, Gregory K. Chen, David T. Blaauw, Dennis Sylvester:
Analyzing the impact of Double Patterning Lithography on SRAM variability in 45nm CMOS. CICC 2010: 1-4
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