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"The impact of device type and sizing on phase noise mechanisms [MOS VCOs]."

Albert C. Jerng, Charles G. Sodini (2003)

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DOI: 10.1109/CICC.2003.1249457

access: closed

type: Conference or Workshop Paper

metadata version: 2021-11-15

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  - https://dblp.org/rec/conf/cicc/JerngS03
Albert C. Jerng, Charles G. Sodini:
The impact of device type and sizing on phase noise mechanisms [MOS VCOs]. CICC 2003: 547-550

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