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"Within-die gate delay variability measurement using re-configurable ring ..."

Bishnu Prasad Das et al. (2008)

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DOI: 10.1109/CICC.2008.4672039

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-17

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Bishnu Prasad Das, Bharadwaj Amrutur, H. S. Jamadagni, N. V. Arvind, V. Visvanathan:
Within-die gate delay variability measurement using re-configurable ring oscillator. CICC 2008: 133-136

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