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"A substrate noise analysis methodology for large-scale mixed-signal ICs."

Wen Kung Chu et al. (2003)

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DOI: 10.1109/CICC.2003.1249420

access: closed

type: Conference or Workshop Paper

metadata version: 2021-11-15

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  - conf/cicc/ChuVCSTHDNIO03
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  - https://dblp.org/rec/conf/cicc/ChuVCSTHDNIO03
Wen Kung Chu, Nishath K. Verghese, Heayn-Jun Chol, Kenji Shimazaki, Hiroyuki Tsujikawa, Shouzou Hirano, Shirou Doushoh, Makoto Nagata, Atsushi Iwata, Takafumi Ohmoto:
A substrate noise analysis methodology for large-scale mixed-signal ICs. CICC 2003: 369-372

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