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"6T SRAM and 3T DRAM data retention and remanence characterization in 65nm ..."

Cagla Cakir, Mudit Bhargava, Ken Mai (2012)

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DOI: 10.1109/CICC.2012.6330672

access: closed

type: Conference or Workshop Paper

metadata version: 2017-06-02

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Cagla Cakir, Mudit Bhargava, Ken Mai:
6T SRAM and 3T DRAM data retention and remanence characterization in 65nm bulk CMOS. CICC 2012: 1-4

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