"Impact of technology scaling on CMOS RF devices and circuits."

Eyad Abou-Allam et al. (2000)

Details and statistics

DOI: 10.1109/CICC.2000.852685

access: closed

type: Conference or Workshop Paper

metadata version: 2022-10-10

a service of  Schloss Dagstuhl - Leibniz Center for Informatics