"Research on Fabric Defect Detection Technology Based on RDN-LTE and ..."

Li Yao, Zhongqin Chen, Yan Wan (2023)

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DOI: 10.1007/978-3-031-50075-6_11

access: closed

type: Conference or Workshop Paper

metadata version: 2024-02-13

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Li Yao, Zhongqin Chen, Yan Wan:
Research on Fabric Defect Detection Technology Based on RDN-LTE and Improved DINO. CGI (3) 2023: 137-148

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