"A hybrid deterministic/genetic test generator to improve fault ..."

Alfredo Cruz (2004)

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DOI: 10.1109/CEC.2004.1331050

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-21

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Alfredo Cruz:
A hybrid deterministic/genetic test generator to improve fault effectiveness and reduce CPU time run. IEEE Congress on Evolutionary Computation 2004: 1325-1330

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