"Evolving More Testable Digital Combinational Circuits."

Nahid Mirzaie, Seyyed Javad Seyyed Mahdavi, Karim Mohammadi (2010)

Details and statistics

DOI:

access: unavailable

type: Conference or Workshop Paper

metadata version: 2010-12-06

a service of  Schloss Dagstuhl - Leibniz Center for Informatics