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"Using search-based metric selection and oversampling to predict fault ..."

Rodrigo A. Vivanco et al. (2010)

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DOI: 10.1109/CCECE.2010.5575249

access: closed

type: Conference or Workshop Paper

metadata version: 2020-10-25

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  - conf/ccece/VivancoKMMJ10
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Rodrigo A. Vivanco, Yasutaka Kamei, Akito Monden, Ken-ichi Matsumoto, Dean Jin:
Using search-based metric selection and oversampling to predict fault prone modules. CCECE 2010: 1-6

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