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"Phase transition in sputtered HfO2 thin films: A qualitative raman study."

Gustavo S. Belo et al. (2012)

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DOI: 10.1109/CCECE.2012.6335030

access: closed

type: Conference or Workshop Paper

metadata version: 2019-10-19

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  dblp key:
  - conf/ccece/BeloNMSMB12
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  - https://dblp.org/rec/conf/ccece/BeloNMSMB12
Gustavo S. Belo, Fabio Nakagomi, Auxence Minko, Sebastião William da Silva, Paulo César de Morais, Douglas A. Buchanan:
Phase transition in sputtered HfO2 thin films: A qualitative raman study. CCECE 2012: 1-4

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