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"Fault coverage improvement and test vector generation for combinational ..."

Mehrnaz Ahmady, Sayed Masoud Sayedi (2012)

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DOI: 10.1109/CCECE.2012.6334825

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-26

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Mehrnaz Ahmady, Sayed Masoud Sayedi:
Fault coverage improvement and test vector generation for combinational circuits using spectral analysis. CCECE 2012: 1-5

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