"Using a two-layer competitive Hopfield neural network for semiconductor ..."

Chuan-Yu Chang, Si-Yan Lin, MuDer Jeng (2005)

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DOI: 10.1109/COASE.2005.1506786

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-25

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Chuan-Yu Chang, Si-Yan Lin, MuDer Jeng:
Using a two-layer competitive Hopfield neural network for semiconductor wafer defect detection. CASE 2005: 301-306

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