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"A Detection Approach for Wafer Detect in Industrial Manufacturing based on ..."

Qian Tao, Yiyang Chen, Hongtian Chen (2023)

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DOI: 10.1109/SAFEPROCESS58597.2023.10295689

access: closed

type: Conference or Workshop Paper

metadata version: 2023-11-16

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  dblp key:
  - conf/caasafeproc/TaoCC23
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Qian Tao, Yiyang Chen, Hongtian Chen:
A Detection Approach for Wafer Detect in Industrial Manufacturing based on YOLOv8. SAFEPROCESS 2023: 1-6

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